PRODUCTS
Ion and Electron Sources
Hyperion® II Ion Source
Available in either Dual-polarity or Positive-only models
Designed for integration on existing ion optical systems, Hyperion® II delivers the highest brightness, best imaging resolution, and longest source lifetime for SIMS applications.
Researchers requiring not only improved imaging resolution but also extended source lifetime for SIMS applications are utilizing Hyperion® II ion sources with their existing SIMS instrumentation. Designed and engineered by Oregon Physics, Hyperion® II is our most advanced high-brightness plasma ion source. Hyperion® II ion sources can be custom-engineered to fit on a wide range of other ion beam analytical systems. Hyperion® II can also be field-retrofitted to focused ion beam (FIB) columns* in order to upgrade a standard Gallium FIB column to a high-current Xenon FIB.
The Hyperion® II ion source is available in two configurations: dual polarity and positive only. The Hyperion® II dual polarity model serves as a direct replacement for the conventional duoplasmatron ion source in a number of instruments.
What makes Hyperion® II ion sources unique are not only their availability as field-upgradeable ion sources for existing instruments from a variety of manufacturers, but also their high brightness and capacity (model-dependent) for dual polarity operation. Hyperion® II dual polarity model ion sources utilize inert gases (e.g. Xenon, Argon, Helium) for positive ion extraction and electronegative gas species (e.g. Oxygen, Hydrogen) for negative and positive ion extraction.
All Hyperion® II ion sources are liquid cooled for low temperature operation, equipped with integrated sensors and safety interlocks, and boast a much longer lifespan than other ion sources due to their cathodeless source design.
The Hyperion® II ion source is ideal for surface and material analysis applications in a number of fields, including nuclear forensics, electronics research, cell biology, geology, geochronology, metallurgy, and astro-chemistry. Hyperion® II is also uniquely well-suited to focused ion beam (FIB) micro-machining applications with its ± 25keV operation. Field-proven for reliability, lifetime, and brightness, the Hyperion® II ion source is designed to bolt onto your existing optical system, delivering significant improvements to these specific applications, and many others:
- SIMS analysis of dielectric materials (O-)
- Ultra-high depth resolution depth profiling (O2+)
- Accurate measurements of isotope abundance in nuclear physics and geo-physics, non-conducting materials (SIMS, (O-))
- Co-axial primary and secondary ion optics, where a negatively charged, electronegative primary ion beam is required with electropositive secondary ion analysis (e.g. NanoSIMS50)
Achieve improved data acquisition and imaging performance on your existing ion optical system by retrofit-replacing* the ion source with Hyperion® II: the brightest, most reliable, and longest-lifetime solution for your ion source needs. Hyperion® II is compatible with many instruments as-is, but Oregon Physics is happy to provide custom modifications to facilitate other instrument setups as well.
Hyperion® II Essential Specifications:
Dual-polarity sources
- Utilize electronegative gas species (Hydrogen, Oxygen)
- 0 to ±25keV operation
- Lifetime >2 years (positive mode), >2000 hours (negative mode)
- Low axial energy spread: 5ev (positive ions), 3.5eV (negative ions)
- Serve as a direct replacement for the conventional duoplasmatron ion source in a number of instruments
Positive-only sources
- Utilize inert gases (Xenon, Argon, Neon, Helium, Oxygen)
- 0 to +30keV (Xenon, Argon, Helium) or 0 to +10keV (Neon) operation
- Lifetime >2 years (positive mode)
- Low axial energy spread: 5ev (positive ions)
General specifications (mode-independent)
- Stability <1% drift/hour, <5% drift/24 hours
Contact us to learn how Hyperion II® can be integrated into your current instrument setup or to discuss your specific research application.
*Contact Oregon Physics to determine if you have a compatible optical system.