Publications

Nuclear Forensics Using Plasma Source Ion Beams
R.W. Boswell, Noel S. Smith, Christine Charles, Noel P. Martin, Paul P. Tesch, ECS Meeting Abstracts, MA2014-02, 1668-1668 (2014)

Advances in Source Technology for Focused Ion Beam Instruments
Noel S. Smith, John A. Notte and Adam V. Steele MRS Bulletin, p1, Vol. 39, April (2014)

Ex situ lift out of PFIB prepared TEM Specimens
Giannuzzi L.A. and Smith N.S., Microsc. Microanal. 20, (Supp 3), p340 (2014)

High voltage isolation and cooling for an inductively coupled plasma ion source
Noel S. Smith, Noel P. Martin, Paul P. Tesch, US Patent # 8,525,419, Sept (2013)

Characterization of Coatings with Ion and Electrons
Lucille A. Giannuzzi, Noel S. Smith and Sanjay Sampath, Microscopy and Microanalysis, 19 (Suppl 2), p1862, 2013.

TEM Specimen Preparation with Plasma FIB Xe+ Ions
Giannuzzi L.A. and Smith N.S., Microsc. Microanal. 17 (2) p646 (2011)

New Ion Probe for Next Generation FIB, SIMS and Nano-Ion Implantation
N. S. Smith, P. P. Tesch, N. P. Martin, R. W. Boswell, Microscopy Today, p18, Sept 2009.

Nanoscale to Millimeter Scale Milling with a Focused Ion Beam Instrument
Tesch P., Smith N., Martin N., Kinion D. EIPBN Poster Presentation 2008

A High Brightness Source for Nano-Probe Secondary Ion Mass Spectrometry
N. S. Smith, P. P. Tesch, N. P. Martin, D. E. Kinion, Applied Surface Science 255, p1606, 2008

High Current Focused Ion Beam Instrument for Destructive Physical Analysis Applications
Tesch P., Smith N., Martin N., Kinion D., ISTFA 2008, p7 (2008).