Research & Development > Nanoscale FIB Milling

Technical Publications

Nanoscale to Millimeter Scale Milling with a Focused Ion Beam Instrument
Paul Tesch, Noel Smith, Noel Martin, Doug Kinion
Presented at the EIPBN conference in Portland, OR, USA, May 2008.

High Current Focused Ion Beam Instrument for Destructive Physical Analysis Applications
Paul Tesch, Noel Smith, Noel Martin, Doug Kinion
To be presented at the the 34th International Symposium for Testing and Failure Analysis conference in November 2008
Link coming soon.

High Brightness Plasma Ion Source for Analysis and Fabrication at the Micro and Nanoscale
Paul Tesch, Noel Smith, Noel Martin, Doug Kinion
To be presented at the Micro & Nano Engineering 08 Conference September 2008
Link coming soon.

 

 

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