- Innovative Sources for SIMS
- Nanoscale FIB Milling
- Ion Sources for Accelerator Applications
Research & Development
Innovative Sources for SIMS
High Brightness Plasma Ion Source for SIMS
The higher brightness, lower energy spread and much longer lifetime of our plasma ion source, compared to the conventional Duoplasmatron oxygen source, makes this technology extremely attractive for dynamic and static secondary ion mass spectrometry (SIMS) applications.
Oregon Physics, LLC
2704 SE 39th Loop, Suite 109 • Hillsboro, OR 97123 USA
Phone: 503.601.0041 • Fax: 503.601.0041 • Email: info@oregon-physics.com
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